Nikon A1R Confocal & Super Resolution System
This is a high-speed A1R confocal microscope combined with a SIM super resolution system. The Nikon Eclipse Ti-E inverted microscope is built with fully automated objectives, stage, and filter turrets. The microscope is housed in an enclosure with a stage top chamber for CO2, and humidity control.
Capabilities
Fixed and live sample imaging
Bright-field, phase contrast, and fluorescence imaging
FRET (Fluorescence Resonance Energy Transfer)
FRAP (Fluorescence Recovery After Photobleaching)
Multipoint acquisition, Multichannel acquisition, Large image scan (image stitching), Z-stack, and 2D/3D deconvolution.
Strength of SIM
The lateral resolution of the super resolution system can reach to 85-115nm, and the axial resolution can reach to 270nm. This doubles the resolution of a conventional confocal microscope.
PFS: Perfect Focus System with a 3 mm range to combat focal drift and maintain long term time-lapse focus stability.
Lasers
405nm, 488nm, 561nm, 640nm
AOTF (Acousto-Optical Tunable Filter) installed
Detectors
Transmitted light detector
Two GasApe detectors (for lasers 488 and 561)
Two standard detectors (for lasers 405 and 640)
Objectives
|
Obj |
Objective |
Medium |
Use |
|---|---|---|---|
|
10x |
Plan Apo 10x/0.45NA |
Dry |
Confocal |
|
20x |
Plan Apo VC 20x/0.75NA DIC |
Dry |
Confocal |
|
40x |
Plan Fluor 40x/1.30NA DIC |
Oil |
Confocal |
|
60x |
Apo 60x/1.40NA DIC |
Oil |
Confocal |
|
100x |
SR Apo TIRF 100x/1.49NA |
Oil |
Confocal/SIM |
Samples
Confocal optical sectioning is best for samples less than 100 microns thick.
SIM imaging is best for samples less than 20 microns thick
Deconvolution is best for samples no more than 5 microns thick.
Software
Nikon NIS-Elements C software in a Windows 10 operating system
Contact Us
Małgorzata (Margo) Bieńkowska-Haba, PhD
Research Specialist, Microscopy
Malgorzata.Bienkowskahaba@lsuhs.edu
(318) 675-8537
Kelly Tatchell, PhD
Scientific Adviser, Microscopy
Professor and Chairman of Biochemistry & Molecular Biology
Kelly.Tatchell@lsuhs.edu
(318) 675-5163